Bantam-Pak®'s integration with world class performance boards from ECT's Semiconductor Test Group assures you of smooth AC response back to the test head, delivered by a supplier that understands test.

For too long test engineers have been forced to make tradeoffs between AC performance and Z-Axis compliance. Now, the Bantam-Pak® delivers both incredible AC performance AND the compliance needed for reliable semiconductor testing.

Bantam-Pak® is a scalable family of test sockets for high performance, area-array applications. Designed around Bantam® probe technology from ECT's Contact Products Group, the Bantam-Pak® family meets the needs for a variety of pitch requirements, including 1.27mm, 1.0mm, .8mm and .75mm, .65mm and .5mm.

Four decades of applied technology
With Bantam-Pak®, ECT brings nearly forty years of proven experience to your test floor. Bantam-Pak®'s architecture coupled with ECT's design and manufacturing capabilities results in Bantam-Pak®'s ability to handle a wide variety of applications including ceramic and organic packages, plus solder bumped and precious metal lands/pads. Bantam-Pak® contactors have been successfully applied in wireless communications, low-noise analog, and ultra high-speed logic. Each application is subject to a rigorous tolerance analysis prior to actual design to assure the maximum pointing accuracy possible on point of contact at both the performance board and the DUT.

Developed for high-volume production test
ECT Bantam-Pak® contactors are designed for high performance and long life. The designs emphasize yield-optimizing electrical performance and high reliability for high-volume production test. Bantam® contactor technology utilizes Bantam® spring probes which offer industry leading, Pogo®-like compliance, and a single sliding/wiping contact which achieves more consistent resistance throughout the life of the Pogo contact. The Bantam® contactor family includes contactors for BGA, µBGA, CSP, LGA, and PGA packages.

Revolutionary probe design
reduces resistance deviation
The Bantam® probes are retained in the socket body in such a way that a small amount of the probe's total capable deflection is dedicated to maintaining preload against the performance board. The preload prevents the probe from continuously making and breaking contact with the performance board. Making and breaking contact can be a source of performance board pad wear, as well as a changing resistive value between the probe tip and the pad.

Bantam-Pak® Test Contactor Features & Benefits