Gates for
Opens Testing

Opens Gate
Conversion Kits

TestJet
configuration

Opens Xpress
Configuration

WaveScan
Configuration

Unpowered
Lid Assembly

Hanger Probes

ECT gate assemblies and sensor component kits and customized fixtures are offered for Hewlett-Packard TestJet, GenRad Opens Xpress and Teradyne WaveScan opens technology.

Opens Testing Gate Assemblies

Opens Testing Gate assemblies are precision-engineered, heavy-duty aluminum units.

  • A positive latch mechanism locks the assembly securely for testing and releases easily for UUT change.
  • Opens to approximately 90 degrees for easy access to the UUT and probes.
  • A gas spring holds the unit open at any angle.
  • Gate assemblies are designed for use with SKM, SKL, HEK3 and HEK5 size fixtures.

Customized Opens Testing Fixtures include:

  • The specified fixture
  • Gate assembly
  • Opens testing probes
  • Signal conditioner board
  • Conventional test probes and wiring installed to customer specifications.

The fixture is performance tested and certified prior to shipment.


Opens Gate Conversion Kits

Opens Gate Conversion Kits are used to modify standard hold-down gates for opens testing applications. Each kit includes:

  • Riser frame
  • Polycarbonate plate to replace push fingers
  • Metal cover
  • Complete assembly and wiring instructions

Opens Gate Conversion Kits
Component
Part No.
SKS Opens Gate, 5x7.5 (127x190) 804941
SKM Opens Gate, 13x7.5 (330x190) 804942
SKM 90o Opens Gate, 8.5x11.5 (216x292) 806040
SKL Opens Gate, 17.5x11.5 (444x292) 804943
How to Order
Order by part number

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TestJet Configuration

Hewlett-Packard TestJet Gate Kits
Component
Part No.
SKM/HEK3-3070 Opens Gate, 9x10.5 (228x267) 804461
SKL/HEK5-3070 Opens Gate, 9.5x22 (241x559) 804920
TestJet Signal Conditioner 804352
HP TestJet Probe 804353
TestJet Sensor Plate, SO 14,16 804355
TestJet Sensor Plate, SO 20 804356
TestJet Sensor Plate, 1.2 x 1.2(30.5x30.5) 804357
TestJet Sensor Plate, 2.5 x2.5(63.5x63.5) 804358
TestJet Tool Kit 806088
Push Fingers for TestJet/Opens Gates
Component
Part No.
 .750 long 804581
1.250 long 806572
 
How to Order
Order by part number

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Opens Xpress Configuration

GenRad Opens Xpress Sensor Kits
Component
Part No.
Probe Sensor, 1.07x1.07 (27x27) 804871
Probe Sensor, .50x.30 (12.7x7.6) 804872
Probe Sensor, .77x.53 (19.5x13.5) 804873
Probe Sensor, .94x.94 (23.8x23.8) 804874
Probe Sensor, .73x.33 (18.5x8.4) 804875
Probe Sensor, 6.25x.44 (158.8x11.2) 804876
Buffer Board 804877
Mux Card 804878
Cable/Buffer/Mux 804879
Cable/Mux/Receiver 804880
How to Order
Order by part number

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WaveScan configuration

Teradyne WaveScan Kits
Component
Part No.
Basic Kit 806045
Expander Kit 806046
Probe Inducer, .300x.500 (7.62x12.7) 806047
Probe Inducer, .325x.325 (8.3x8.3) 806048
Probe Inducer, .500x.500 (7.62x7.62) 806049
Probe Inducer, .600x.600 (15.2x15.2) 806050
How to Order
Order by part number

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Unpowered Lid Assembly

ECT's newest unpowered lid assembly offers an economical solution that can be added to any fixture style.

  • Unpowered opens sensors, amplifiers, cards and buffer boards mount easily.
  • Ergonomic handle has been designed for ease of operation.
  • Once configured, a cover protects the wires and pieces from exposure.
  • Optional riser package is available for products with tall components.

Unpowered Opens Testing
Component
Part No.
Sensor Plate, .375x.475 (pkg 10) 806437
Sensor Plate, .425x.575 (pkg 10) 806438
Sensor Plate, 1.25x1.25 (pkg 10) 806435
Sensor Plate, 2.56x2.56 806436
Sensor Plate, .500x6.25 806439
Sensor Connection Board 806448
Amplified Sensor Connection Board 804855
Unpowered Opens Tool Kit* 806088
 
Unpowered Opens Lid Assembly
Component Part No.
SKS, 6.35x10.90 806300
SKM, 10.49x15.40 806301
SKM-3070/HEK3, 11.70x11.40 806302
SKL, 14.50x21.38 806303
SKL-3070/HEK5, 11.70x25.00 806304
SKM-DW, 10.90x14.30 806305
SKS-DW, 7.40x10.49 806306
 
How to Order
Order by part number

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Hanger Probes

The compliant motion of the ECT hanger style probes is perfect for use with non-level or non-parallel applications. By lessening the side forces, there is less opportunity for damage to the sensor plates and/or the component under test.

 

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