| Test
Center in. (mm) |
Root Part Number |
Application |
| .020
(0.50) |
CSP5 |
Semiconductor
Probes |
| .030
(0.762) |
IP20 |
IC
Test Probes |
| .030
(0,80) |
CSP8 |
Semiconductor
Probes |
| .039
(1.00) |
IP27 |
IC
Test Probes |
| .050
(1.27) |
DER-50 |
Double-Ended
Receptacles |
| POGO®-72 |
Loaded
PCB Test Probes |
| DER28-IP261 |
Test
System Interface Probes
|
| IP261 |
Loaded
PCB Test Probes
May be suited to: Bare PCB Test Applications and IC Test Applications |
| IP271 |
Loaded
PCB Test Probes
May be suited to: Bare PCB Test Applications and IC Test Applications
|
| P2662A |
Loaded
PCB Test Probes
May be suited to: IC Test Applications |
| P2662B |
Loaded
PCB Test Probes
May be suited to: IC Test Applications
|
| .075
(1.91) |
DER-75 |
Double-Ended
Receptacles |
| POGO®-1 |
Loaded
PCB Test Probes |
| DRP27P55 |
IC
Test Probes |
| P2663 |
Loaded
PCB Test Probes
May be suited to: Bare PCB Test Applications |
| IP40 |
General
Purpose Probes
|
| .100
(2.54) |
DER-100 |
Double-Ended
Receptacles |
| FRP-25T |
Test
System Interface Probes |
| GSP-2B |
Test
System Interface Probes |
| SIP-90 |
Test
System Interface Probes |
| GPP-95-2 |
Test
System Interface Probes |
| POGO®-25 |
Loaded
PCB Test Probes |
| BGP52L30-DE-LV |
IC
Test Probes |
| BGP52L30-DE-SV |
IC
Test Probes |
| IP54H-1INS |
General
Purpose Probes |
| PIN54SG-1 |
General
Purpose Probes |
| HIA-MT54-G |
Test
System Interface Probes
|
| BC54T65 |
Battery/Portable
Application Probes
|
| BC54T33 |
Battery/Portable
Application Probes
|
| BC57T30 |
Battery/Portable
Application Probes
|
| P3158 |
Loaded
PCB Test Probes
May be suited to: General Purpose Applications |
| P5160 |
Loaded
PCB Test Probes
May be suited to: General Purpose Applications |
| LT54 |
Loaded
PCB Test Probes |
| IP541 |
Loaded
PCB Test Probes
May be suited to: Bare PCB Test Applications |
| P2664 |
Bare
PCB Test Probes
May be suited to: General Purpose Applications |
| MT54 |
Bare
PCB Test Probes |
| MT554 |
Bare
PCB Test Probes
|
| .125
(3.18) |
P2665 |
High
Current Probes
May be suited to: General Purpose Applications |
| BC92H-DE |
Battery/Portable
Application Probes
|
| IP80 |
High
Current Probes
May be suited to: General Purpose Applications |
| HC80 |
High
Current Probes
May be suited to: General Purpose Applications |
| MT54 |
Bare
PCB Test Probes |
| .156
(3.96) |
MT554 |
Bare
PCB Test Probes |
| MT54 |
Bare
PCB Test Probes |
| .187
(4.75 |
IP125 |
High
Current Probes
May be suited to: General Purpose Applications |
| AW125L120-0 |
General
Purpose Probes |
| HC93 |
High
Current Probes
May be suited to: General Purpose Applications |
| MT554 |
Bare
PCB Test Probes |
| P2757 |
High
Current Probes
May be suited to: General Purpose Applications |
| IP93 |
High
Current Probes
May be suited to: General Purpose Applications |
| HC125 |
High
Current Probes
May be suited to: General Purpose Applications |