Root Part Number	Test Center in. (mm)
SPL-40G-029	.039 (1.00)
SPL-40H-015	.039 (1.00)
HPA-40	.039 (1.00)
SPL-00U-063	.050 (1.27)
SPL-50H-006	.050 (1.27)
SPL-00H-042	.050 (1.27)
HPA-0	.050 (1.27)
SPA-0	.050 (1.27)
SPL-01B-033	.075 (1.91)
SPL-01B-060	.075 (1.91)
SPL-641-016	.100 (2.54)
SPA-64	.100 (2.54)
EPA-2X	.100 (2.54)
SPA-64	.125 (3.18)
SPA-64	.156 (3.96)
SPA-64	.187 (4.75)

IC Test Probes
These ECT probes provide the reliability and performance required for testing today's high lead count, high speed microprocessors and other ICs. Unmatched electrical performance, short probe lengths for high speed circuit testing, and a wide selection of suitable probe and tip styles have made ECT the primary supplier of IC test probes to the United States' two leading microprocessor manufacturers.