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Test System |
The new Eclipse linear probe test system simply overshadows the competition, combining speed and accuracy in one remarkable machine. With blazing fast test speeds and unrivaled accuracy, the Eclipse is ideal for ultra-fine pitch testing and satisfying your quick-turn requirements.
To reduce the number of probe actions, ECT uses its proprietary measurement-reduction algorithms, so 100% tests are performed more quickly. Only a single test per net is needed to identify shorts, so each of Eclipse's four probes, (two per side) works independently to speed up throughput. A two-probe measurement between suspected faulty nets diagnoses and confirms shorts. Therefore, when testing extremely high point count boards, or low PCB quantities where fixtured systems are cost prohibitive, Eclipse is the answer to putting prototypes quickly back in your customers' hands. New Features Eclipse has a new overall futuristic design as well as accuracy specifications that move it beyond other's capabilities and yield positional resolutions for faster test speeds and higher performance sub-systems.
Sleek Appearance Advances Function Ergonomically considerate of operators, the Eclipse's state-of-the-art design places all keyboard and monitor test functions at a comfortable and natural height providing easy access to all controls while viewing the machine's interior. This is especially helpful during setup. Once test parameters are in place, automation takes over, leaving the operator free to perform elsewhere if desired.
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