Linear Probe
Test System
 

The new Eclipse™ linear probe test system simply overshadows the competition, combining speed and accuracy in one remarkable machine. With blazing fast test speeds and unrivaled accuracy, the Eclipse™ is ideal for ultra-fine pitch testing and satisfying your quick-turn requirements.

  • Ergonomically designed, double sided, flying probe tester.

  • Optimized to test ultra-fine circuit geometry's down to 2 mil pads and 2 mil pitch, with an accuracy of ±5 microns.

  • Able to test thick or thin hybrid substrates, co-fired ceramics, Mylar and flexible circuits as well as PCB technology, including boards with buried components.

  • Individual probe height adjustability accommodates board cavities of up to 1100 mils.

  • Compatible with some grid based test systems permitting combination test of otherwise unfixturable PCB features, even in high volume.

  • Fault verification capable.

To reduce the number of probe actions, ECT uses its proprietary measurement-reduction algorithms, so 100% tests are performed more quickly. Only a single test per net is needed to identify shorts, so each of Eclipse's™ four probes, (two per side) works independently to speed up throughput.

A two-probe measurement between suspected faulty nets diagnoses and confirms shorts. Therefore, when testing extremely high point count boards, or low PCB quantities where fixtured systems are cost prohibitive, Eclipse™ is the answer to putting prototypes quickly back in your customers' hands.

New Features

Eclipse™ has a new overall futuristic design as well as accuracy specifications that move it beyond other's capabilities and yield positional resolutions for faster test speeds and higher performance sub-systems.

  • Head-mounted camera provides a real time view of probe-to-pad contact.

  • Choice of active test area up to 24" x 36" (609 mm x 914 mm) adds flexibility to accommodate the largest boards with high accuracy and throughput.

  • Precision closed-loop controlled linear motors on all three probe axes (X, Y, and Z) provide performance and durability in today's test environments. Linear control of all three axes offers far superior positioning accuracy than the commonly used "lead screw" approach.

  • User friendly software supports these powerful, low maintenance motors specifically developed for continuous duty cycle.

  • Intelligent variable Z-axis motors accelerate probe action to provide true 3-dimensional probing.

  • LightTouch™ sensing is achieved by an integrated optical sensor system featuring probe head mounted sensors to detect the instant of contact. Gold pads as minute as 2 mil can be contacted with Eclipse's™ probes without pad damage.

Sleek Appearance Advances Function

Ergonomically considerate of operators, the Eclipse's™ state-of-the-art design places all keyboard and monitor test functions at a comfortable and natural height providing easy access to all controls while viewing the machine's interior. This is especially helpful during setup. Once test parameters are in place, automation takes over, leaving the operator free to perform elsewhere if desired.

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